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Advanced Materials Characterisation - MATS6655 | |||||||||||||||||||||||||||||||||||||||||
Description Selected topics in ceramics, composites, metals, and/or polymers involving the structural, microstructural, and chemical analyses of materials: secondary ion mass spectroscopy (SIMS), X-ray photoelectron spectroscopy (XPS), Auger electron spectroscopy (AES), and laser Raman microscopy.
Note: study arrangements and attendance for this course is made on a case-by-case basis and all enrolments must be processed by the Materials Science School Office only, please contact a.smith@unsw.edu.au |