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Materials Characterisation - MATS6645 | ||||||||||||||||||||||||||||||||||||||
Description Selected topics in ceramics, composites, metals, and/or polymers involving the structural, microstructural, and chemical analyses of materials: X-ray diffraction (XRD), scanning electron microscopy (SEM), transmission electron microscopy (TEM), energy dispersive spectroscopy (EDS), electron probe microanalysis (EPMA), atomic force microscopy (AFM).
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