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Advanced Materials Characterisation - MATS6655 | ||||||||||||||||||||||||||||||||||||||
Description Selected topics in ceramics, composites, metals, and/or polymers involving the structural, microstructural, and chemical analyses of materials: secondary ion mass spectroscopy (SIMS), X-ray photoelectron spectroscopy (XPS), Auger electron spectroscopy (AES), and laser Raman microscopy.
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